Ben Tsai: Inspection and Metrology to Support the Quest for Perfection from wafer testing machine Watch Video
Preview(s):
Gallery
Gallery
Gallery
Play Video: (Note: The default playback of the video is HD VERSION. If your browser is buffering the video slowly, please play the REGULAR MP4 VERSION or Open The Video below for better experience. Thank you!)
Jump To Video Parts
⏲ Duration: 39 minutes 58 seconds 👁 View: 6.2K times
Play Video: (Note: The default playback of the video is HD VERSION. If your browser is buffering the video slowly, please play the REGULAR MP4 VERSION or Open The Video below for better experience. Thank you!)